The MAX3875A is a compact, low-power clock recovery and data retiming IC for 2.488Gbps SDH/SONET applications. The fully integrated phase-locked loop recovers a synchronous clock signal from the serial NRZ data input, which is retimed by the recovered clock. Differential PECL-compatible outputs are provided for both clock and data signals, and an additional 2.488Gbps serial input is available for system loopback diagnostic testing. The device also includes a TTLcompatible loss-of-lock (LOL) monitor.
The MAX3875A is designed for both section-regenerator and terminal-receiver applications in OC-48/STM-16 transmission systems. Its jitter performance exceeds all of the SONET/SDH specifications.
This device operates from a single +3.3V to +5.0V supply over a -40°C to +85°C temperature range. The typical power consumption is only 400mW with a +3.3V supply. It is available in a 32-pin TQFP package, as well as in die form.
Supply Voltage, VCC.........................................-0.5V to +7.0V
Input Voltage Levels
(SDI+, SDI-, SLBI+, SLBI-) ...........(VCC - 0.5V) to (VCC + 0.5V)
Input Current Levels (SDI+, SDI-, SLBI+, SLBI-)..........±10mA
PECL Output Voltage
(SDO+, SDO-, SCLKO+, SCLKO-) ..........................(VCC + 0.5V)
PECL Output Current, (SDO+, SDO-, SCLKO+, SCLKO-)...56mA
Voltage at LOL, SIS, PHADJ+, PHADJ-,
FIL+, FIL- ................................................-0.5V to (VCC + 0.5V)
Continuous Power Dissipation (TA = +85°C)
TQFP (derate 16.1mW/°C above +85°C).......................1.0W
Operating Temperature Range
MAX3875EHJ.................................................-40°C to +85°C
Operating Junction Temperature (die) .......-55°C to +150°C
Storage Temperature Range ......................-60°C to +160°C
Processing Temperature (die) ....................................+400°C
Lead Temperature (soldering, 10sec) ........................+300°C
Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Required Field 
